Publications

MulBERRY: Enabling Bit-Error Robustness for Energy-Efficient Multi-Agent Autonomous Systems
- - Zishen Wan
  - Nandhini Chandramoorthy
  - et al.
- 2024
- ASPLOS 2024
Conference paper
Lost in Translation: A Study of Bugs Introduced by Large Language Models while Translating Code
- - Rangeet Pan
  - Ali Reza Ibrahimzada
  - et al.
- 2024
- ICSE 2024
Conference paper
Dynamic Alert Suppression Policy for Noise Reduction in AIOps
- - Karan Bhukar
  - Harshit Kumar
  - et al.
- 2024
- ICSE 2024
Conference paper
Enterprise-Class Cache Compression Design
- - Alper Buyuktosunoglu
  - David Trilla Rodriguez
  - et al.
- 2024
- HPCA 2024
Conference paper
Data Motion Acceleration: Chaining Cross-Domain Multi Accelerators
- - Shu-Ting Wang
  - Hanyang Xu
  - et al.
- 2024
- HPCA 2024
Conference paper
Spectral Interferometry for TSV Metrology in Chiplet Technology
- - Stefan Schoeche
  - Daniel Schmidt
  - et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Conference paper
EUV patterned gate variation reduction in next generation transistor architectures
- - Gopal Kenath
  - Martin Burkhardt
  - et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Conference paper
Novel ellipsometry-based machine learning technique for characterization of low sensitivity critical dimensions within gate-all-around transistors
- - Houssam Chouaib
  - Valeria Dimastrodonato
  - et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Conference paper
From Lab to Fab - In-line SIMS for Process Control in Nanosheet Gate-All-Around Device Manufacturing
- - Stefan Schoeche
  - Katherine Sieg
  - et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Conference paper
Large Feature Wafer Level In-Line Optical Metrology Techniques for Advanced Packaging Schemes
- - Katherine Sieg
  - Chris Bottoms
  - et al.
- 2024
- SPIE Advanced Lithography + Patterning 2024
Conference paper