MEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON MICROSCOPE.
- O.C. Wells
- P. Coane
- et al.
- 1982
- Microbeam Analysis 1982
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11 results for C.F. Aliotta
An electron microscope investigation of the effect of phosphorous doping on the plasma etching of polycrystalline silicon
- E.A. Irene
- E. Tierney
- et al.
- 2019
- JES
Studies of contamination build up in the SEM using the bse imaging technique
- O.C. Wells
- C.F. Aliotta
- 2011
- Scanning
Hillock formation in lead films by grain boundary sliding
- Maria Ronay
- C.F. Aliotta
- 2008
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Electromigration of Ni in Al thin-film conductors
- F.M. D'Heurle
- A. Gangulee
- et al.
- 2008
- Journal of Applied Physics
Laser sputtering. Part I. On the existence of rapid laser sputtering at 193 nm
- Roger Kelly
- J.J. Cuomo
- et al.
- 1985
- Nuclear Inst. and Methods in Physics Research, B
Investigation of the silicon beading phenomena during zone-melting recrystallization
- Z.A. Weinberg
- V.R. Deline
- et al.
- 1983
- Applied Physics Letters
Reducing the grain size of polycrystalline lead films by the use of nucleants
- Maria Ronay
- C.F. Aliotta
- et al.
- 1982
- Journal of Applied Physics
Schottky barrier height measurement by electron-beam induced voltage
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Applied Physics Letters
Electron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films