SRAM stability characterization using tunable ring oscillators in 45nm CMOS
- Jason Tsai
- Seng Oon Toh
- et al.
- 2010
- ISSCC 2010
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7 results for Liang-Teck Pang
A shorted global clock design for multi-GHz 3D stacked chips
- Liang-Teck Pang
- Phillip J. Restle
- et al.
- 2012
- VLSI Circuits 2012
Fixed- and variable-length ring oscillators for variability characterization in 45nm CMOS
- Ji-Hoon Park
- Liang-Teck Pang
- et al.
- 2009
- CICC 2009
Technology variability from a design perspective
- Borivoje Nikolić
- Ji-Hoon Park
- et al.
- 2011
- IEEE TCAS-I
Large-scale SRAM variability characterization in 45 nm CMOS
- Zheng Guo
- Andrew Carlson
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- Liang-Teck Pang
- Kun Qian
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Measurements and analysis of process variability in 90 nm CMOS
- Liang-Teck Pang
- Borivoje Nikolić
- 2009
- IEEE Journal of Solid-State Circuits