Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs
- Hiroshi Miki
- M. Yamaoka
- et al.
- 2011
- VLSI Technology 2011
Publications
109 results for David J. Frank
Noniterative compact modeling for intrinsic carbon-nanotube FETs: Quantum capacitance and ballistic transport
- Lan Wei
- David J. Frank
- et al.
- 2011
- IEEE T-ED
Impact of HK / MG stacks and future device scaling on RTN
- Naoki Tega
- Hiroshi Miki
- et al.
- 2011
- IRPS 2011
Hysteretic drain-current behavior due to random telegraph noise in scaled-down FETs with high-κ/metal-gate stacks
- Hiroshi Miki
- Naoki Tega
- et al.
- 2010
- IEDM 2010
Practical strategies for power-efficient computing technologies
- Leland Chang
- David J. Frank
- et al.
- 2010
- Proceedings of the IEEE
Reduction of random telegraph noise in high-κ / metal-gate stacks for 22 nm generation FETs
- N. Tega
- H. Miki
- et al.
- 2009
- IEDM 2009
A non-iterative compact model for carbon nanotube FETs incorporating source exhaustion effects
- Lan Wei
- David J. Frank
- et al.
- 2009
- IEDM 2009
Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm
- N. Tega
- H. Miki
- et al.
- 2009
- VLSI Technology 2009
Operational amplifier based test structure for quantifying transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2009
- IEEE Trans Semicond Manuf
Upside-down FETS
- D.C. La Tulipe Jr.
- D.J. Frank
- et al.
- 2008
- IEEE International SOI Conference 2008