Stable SRAM cell design for the 32 nm node and beyond
Leland Chang, David M. Fried, et al.
VLSI Technology 2005
In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy. © 2010 IEEE.
Leland Chang, David M. Fried, et al.
VLSI Technology 2005
Hon-Sum Philip Wong, David J. Frank, et al.
Proceedings of the IEEE
Swagath Venkataramani, Jungwook Choi, et al.
PACT 2017
Kaship Sheikh, Shu Jen Han, et al.
ISCAS 2016