Titanium silicide/titanium nitride full metal gates for dual-channel gate-first CMOS
- Martin M. Frank
- Cyril Cabral
- et al.
- 2016
- IEEE Electron Device Letters
Publications
116 results for Conal Murray
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS
Efficient modeling of Bragg coherent x-ray nanobeam diffraction
- Stephan O. Hruszkewycz
- Martin V. Holt
- et al.
- 2015
- Optics Letters
Stress determination through diffraction: Establishing the link between Kröner and Voigt/Reuss limits
- Conal E. Murray
- Jean L. Jordan-Sweet
- et al.
- 2015
- Powder Diffraction
Linking strain anisotropy and plasticity in copper metallization
- Conal E. Murray
- Jean L. Jordan-Sweet
- et al.
- 2015
- Applied Physics Letters
Nanoscale strain distributions in embedded SiGe semiconductor devices revealed by precession electron diffraction and dual lens dark field electron holography
- Yun-Yu Wang
- David Cooper
- et al.
- 2015
- Applied Physics Letters
Strain imaging of nanoscale semiconductor heterostructures with x-ray bragg projection ptychography
- Martin V. Holt
- Stephan O. Hruszkewycz
- et al.
- 2014
- Physical Review Letters
Origin of stress gradients induced in capped, copper metallization
- 2014
- Applied Physics Letters
Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction
- Judson R. Holt
- Anita Madan
- et al.
- 2013
- Journal of Applied Physics
High-performance Si1-xGex channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- P. Hashemi
- M. Kobayashi
- et al.
- 2013
- VLSI Circuits 2013