The effect of current density, stripe length, stripe width, and temperature on resistance saturation during electromigration testing
- R. Filippi
- R.A. Wachnik
- et al.
- 2002
- Journal of Applied Physics
Publications
37 results for Dureseti Chidambarrao
Backside sputter depth profiling of phosphorus diffusion from a polysilicon source
- P.A. Ronsheim
- D. Chidambarrao
- et al.
- 2002
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Dislocation modeling for the silicon world
- K.W. Schwarz
- X.H. Liu
- et al.
- 2001
- Materials Science and Engineering: A
Dislocation dynamics near film edges and corners in silicon
- K.W. Schwarz
- D. Chidambarrao
- 1999
- Journal of Applied Physics
Nitrogen implantation and diffusion in silicon
- Lahir Shaik Adam
- Mark E. Law
- et al.
- 1999
- MRS Spring Meeting 1999
Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading
- D. Chidambarrao
- Y.C. Song
- et al.
- 1997
- Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Thin-film temperature rise estimates during low energy ion bombardment in a plasma reactor
- M. Naeem
- D. Chidambarrao
- 1995
- Applied Physics Letters