Effect of Capping Layer Under Forming Gas Anneal for Back-End-of-Line Oxide Semiconductor FETs
- Saketh Ram Mamidala
- Antonio La Porta
- et al.
- 2025
- DRC 2025
Publications
18 results for Antonio La Porta
On-Chip Training and Inference using Analog CMO/HfOx ReRAM Artificial Synapses
- Donato Francesco Falcone
- Victoria Clerico
- et al.
- 2025
- Neuronics 2025
Hardware Implementation of Ring Oscillator Networks Coupled by BEOL Integrated ReRAM for Associative Memory Tasks
- Wooseok Choi
- Thomas Van Bodegraven
- et al.
- 2025
- IMW 2025
Cryogenic Analog 1T-ReRAM with Enhanced Dynamic Range and Suppressed Noise for Cold Neural Networks
- Saketh Ram Mamidala
- Davide Lombardo
- et al.
- 2024
- IEDM 2024
Analog Conductive-Metal-Oxide/HfOx ReRAM Devices - BEOL Integration, Characterization and Modelling
- 2024
- MRS Fall Meeting 2024
Advancements in Memristor Device Development: From Material Stack Optimization to Physical Modelling
- 2024
- B-MRS 2024
Compact Model of Conductive-Metal-Oxide/HfOx Analog Filamentary ReRAM Devices
- Matteo Galetta
- Donato Francesco Falcone
- et al.
- 2024
- ESSERC 2024
Read Noise Analysis in Analog Conductive-Metal-Oxide/HfO𝑥 ReRAM Devices
- Davide Lombardo
- Saketh Ram Mamidala
- et al.
- 2024
- DRC 2024
CMOS compatible Materials and Devices for beyond von Neumann
- 2024
- CIMTEC 2024
Analytical modelling of the transport in analog filamentary conductive-metal-oxide/HfOx ReRAM devices
- Donato Francesco Falcone
- Stephan Menzel
- et al.
- 2024
- Nanoscale Horizons