Frequency-Modulated Charge Pumping: Defect Measurements With High Gate Leakage
- Jason Thomas Ryan
- Richard G. Southwick
- et al.
- 2024
- IEEE Electron Device Letters
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6 results for Jason T. Ryan
Constant shape factor frequency modulated charge pumping (FMCP)
- J.T. Ryan
- J.P. Campbell
- et al.
- 2013
- IIRW 2013
Reliability monitoring for highly leaky devices
- J.T. Ryan
- J.P. Campbell
- et al.
- 2013
- IRPS 2013
Observation of strong reflection of electron waves exiting a ballistic channel at low energy
- Canute I. Vaz
- Changze Liu
- et al.
- 2016
- AIP Advances
Frequency-modulated charge pumping with extremely high gate leakage
- Jason T. Ryan
- Jibin Zou
- et al.
- 2015
- IEEE T-ED
Origin of the flatband-voltage roll-off phenomenon in metal/high-k gate stacks
- Gennadi Bersuker
- Chang Seo Park
- et al.
- 2010
- IEEE T-ED