Revealing SRAM memory content using spontaneous photon emission
- Franco Stellari
- Peilin Song
- et al.
- 2016
- VTS 2016
Publications
Date
Featured collections
Popular topics
7 results for John Sylvestri
Advanced fault localization through the use of tester based diagnostics with LVI, LVP, CPA and PEM
- Laura Safran
- John Sylvestri
- et al.
- 2013
- ISTFA 2013
Optical nanoprobe electrical microscopy
- Stephen Ippolito
- Michael Tenney
- et al.
- 2013
- ISTFA 2013
On-chip power supply noise measurement using time resolved emission (TRE) waveforms of light emission from off-state leakage current (LEOSLC)
- Franco Stellari
- Peilin Song
- et al.
- 2009
- IEEE ITC 2009
Angular spectrum tailoring in solid immersion microscopy
- S.B. Ippolito
- P. Song
- et al.
- 2009
- SPIE OPTO 2009
Optical diagnostics for IBM POWER6 TM Microprocessor
- Peilin Song
- Stephen Ippolito
- et al.
- 2008
- IEEE ITC 2008
Angular spectrum tailoring in solid immersion microscopy for circuit analysis
- S.B. Ippolito
- P. Song
- et al.
- 2008
- Applied Physics Letters