Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- Xiaobin Yuan
- Jae-Eun Park
- et al.
- 2007
- IIRW 2007
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15 results for Jing Wang
Experimental analysis of on-wafer de-embedding techniques for RF modeling of advanced RFCMOS and BiCMOS technologies
- Jing Wang
- Robert Groves
- et al.
- 2007
- ARFTG 2007
RF characterization and parameter extraction for CMOS device models
- John J. Pekarik
- Basanth Jagannathan
- et al.
- 2007
- SiRF 2007
Gate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- Sungjae Lee
- et al.
- 2014
- IEEE TCAS-I
Gate-induced-drain-leakage current in 45-nm CMOS technology
- Xiaohin Yuan
- Jae-Eun Park
- et al.
- 2008
- IEEE T-DMR