Functional Testing of AI Cores through Thinned 3D I/O Buffer Dies in 3D Die-Stacked ModulesMukta FarooqArvind Kumaret al.2022ECTC 2022
BEOL compatible high-capacitance MIMCAP structure using a novel high k materialP. JamisonJohn Masseyet al.2020IMCS 2020
Essential edge protection techniques for successful multi-wafer stackingJoshua RubinKevin Winstelet al.2015S3S 2015