Key parameters affecting STT-MRAM switching efficiency and improved device performance of 400°C-compatible p-MTJsGuohan HuM. G. Gottwaldet al.2017IEDM 2017
Dependence of Voltage and Size on Write Error Rates in Spin-Transfer Torque Magnetic Random-Access MemoryJ. J. NowakRaphael P. Robertazziet al.2016IEEE Magnetics Letters