Reversing a decades-long scaling law of dielectric breakdown for ReRAM forming voltage reduction - Modeling competition among defect generation and annihilation processes
- Ernest Y Wu
- Takashi Ando
- et al.
- 2023
- IEDM 2023
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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8 results for Takashi Ando
A Novel Electrical Bias Technique to Recover Degraded ReRAM Arrays for Deep Learning
- Fabia Farlin Athena
- Nanbo Gong
- et al.
- 2023
- MRS Fall Meeting 2023
Systematic multiple filament statistical methodology using a successive varying-voltage technique for series resistance effect in post-breakdown (forming) characterization
- Ernest Y Wu
- Baozhen Li
- et al.
- 2022
- IEDM 2022
Electrochemical Control of Resistance States in Metal Oxide Bilayer Stack
- Thomas Defferriere
- Baoming Wang
- et al.
- 2022
- MRS Fall Meeting 2022
Effects of Crystallization on the Conductance of HfOx ReRAM by In Situ TEM Method
- Alexandre Foucher
- Baoming Wang
- et al.
- 2022
- MRS Fall Meeting 2022
Measuring Ionic Mobility in Oxide Thin Films by Dynamic I-V Analysis–Impact of Interfaces
- Dmitri Kalaev
- Baoming Wang
- et al.
- 2021
- MRS Fall Meeting 2021
Hardware Algorithm Co-optimization for Scalable Analog Compute Technology
- Takashi Ando
- 2022
- SISC 2022
Analog resistive switching devices for training deep neural networks with the novel Tiki-Taka algorithm
- Tommaso Stecconi
- Valeria Bragaglia
- et al.
- 2024
- Nano Letters