A study of process-related electrical defects in SOI lateral bipolar transistors fabricated by ion implantation
- Jeng-Bang Yau
- Jin Cai
- et al.
- 2018
- Journal of Applied Physics
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.