Flexible test mode design for DRAM characterization
- H. Wong
- T. Kirihata
- et al.
- 1996
- VLSI Circuits 1996
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5 results for Munehiro Yoshida
Flexible test mode approach for 256-Mb DRAM
- Toshiaki Kirihata
- Hing Wong
- et al.
- 1997
- IEEE Journal of Solid-State Circuits
Fault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEEE Journal of Solid-State Circuits
A 286 mm2 256 Mb DRAM with ×32 both-ends DQ
- Yohji Watanabe
- Hing Wong
- et al.
- 1996
- IEICE Transactions on Electronics
Fault-tolerant designs for 256 Mb DRAM
- Toshiaki Kirihata
- Yohji Watanabe
- et al.
- 1996
- IEICE Transactions on Electronics