Publications

4 results for Charles J. Montrose

Breakdown measurements of ultra-thin SiO₂ at low voltage
- - J.H. Stathis
  - A. Vayshenker
  - et al.
- 2000
- VLSI Technology 2000
Cosmic ray soft error rates of 16-Mb DRAM memory chips
- - James F. Ziegler
  - Martin E. Nelson
  - et al.
- 1998
- IEEE Journal of Solid-State Circuits
Accelerated testing for cosmic soft-error rate
- - J.F. Ziegler
  - H.P. Muhlfeld
  - et al.
- 1996
- IBM J. Res. Dev
IBM experiments in soft fails in computer electronics (1978-1994)
- - J.F. Ziegler
  - H.W. Curtis
  - et al.
- 1996
- IBM J. Res. Dev