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ASP-DAC 2008
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
Lerong Cheng, Jinjun Xiong, et al.
ASP-DAC 2008
M.F. Cowlishaw
IBM Systems Journal
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PRX Quantum
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IEEE Communications Magazine