Study of charge trapping as a degradation mechanism in electrically alterable read-only memories
- C. Falcony
- D.J. DiMaria
- et al.
- 1982
- Journal of Applied Physics
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4 results for K.M. DeMeyer
Electrically-alterable read-only-memory using Si-rich SiO2 injectors and a floating polycrystalline silicon storage layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1981
- Journal of Applied Physics
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
TA-A2 Electrically Alterable Read-only Memory Using Si Rich SiO2 Injectors and a Floating Polycrystalline Silicon Storage Layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1980
- IEEE T-ED