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PaperMP-B5 Graded or Stepped Insulator MIS Structures (GI-MIS or SI-MIS)D.J. DiMaria, D.W. DongIEEE T-ED
PaperHigh current injection into SiO2 from Si rich SiO2 films and experimental applicationsD.J. DiMaria, D.W. DongJournal of Applied Physics
PaperOxide scaling limit for future logic and memory technologyJ.H. Stathis, D.J. DiMariaMicroelectronic Engineering
