PaperHigh resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearateM. Pomerantz, Armin SegmüllerThin Solid Films
PaperX-ray diffraction measurement of the Jahn-Teller distortion in TmVO4Armin Segmüller, R.L. Melcher, et al.Solid State Communications
PaperX-ray diffraction studies of thin films and multilayer structuresArmin Segmüller, I.C. Noyan, et al.Progress In Crystal Growth And Characterization
PaperInternal strain in elastically strained germanium and silicon - I. Longitudinal caseArmin SegmüllerPhysik der Kondensierten Materie
