Chin-An Chang, Armin Segmüller, et al.
Applied Physics Letters
Analytical methods for the nondestructive characterization of thin epitaxial films, multilayers and superlattices by x-ray diffraction that have been developed in the last decade are reviewed in three sections: 1. I. Description of the strain state by the strain tensor and determination of homogeneous strains and stresses by double-crystal diffractometry in Bragg case reflection; 2. II. Determination of inhomogeneous strains, such as strain gradients or periodic strain modulations, by double-crystal diffractometry in Bragg case reflection; 3. III. Characterization parallel to the surface by grazing-incidence x-ray diffraction. © 1989.
Chin-An Chang, Armin Segmüller, et al.
Applied Physics Letters
J.M.E. Harper, C. Cabral Jr., et al.
MRS Spring Meeting 1999
C.E. Murray, C.C. Goldsmith, et al.
Powder Diffraction
B. Dieny, V.S. Speriosu, et al.
Journal of Magnetism and Magnetic Materials