S. Tanaka, C.C. Limbach, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Using low-energy electron microscopy we have found a new phase transition on the Si(001) surface at miscut angles smaller than 0.1°. The surface phase separates into facets with 300 terrace width, and regions with much larger, wavy terraces. This wavy phase is stabilized by a reduction of surface-stress-induced strain energy. A theoretical study by Tersoff and Pehlke compares favorably with our observations. © 1992 The American Physical Society.
S. Tanaka, C.C. Limbach, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
F.M. Ross, M. Kammler, et al.
Microscopy and Microanalysis
R.J. Hamers, R.M. Tromp, et al.
Physical Review Letters
J.B. Maxson, D.E. Savage, et al.
Physical Review Letters