G.S. Oehrlein, R.M. Tromp, et al.
ECS Meeting 1983
Using low-energy electron microscopy we have found a new phase transition on the Si(001) surface at miscut angles smaller than 0.1°. The surface phase separates into facets with 300 terrace width, and regions with much larger, wavy terraces. This wavy phase is stabilized by a reduction of surface-stress-induced strain energy. A theoretical study by Tersoff and Pehlke compares favorably with our observations. © 1992 The American Physical Society.
G.S. Oehrlein, R.M. Tromp, et al.
ECS Meeting 1983
S. Kodambaka, F.M. Ross, et al.
MRS Fall Meeting 2006
S. Kodambaka, J. Tersoff, et al.
Microscopy and Microanalysis
Chun Yung Sung, Yu-Ming Lin, et al.
VLSI-TSA 2010