PublicationVLSI-TSA 2006Conference paperVDD scaling for FinFET logic and memory circuits: The impact of process variations and SRAM stabilityVLSI-TSA 2006View publicationAbstractNo abstract available.Home↳ PublicationsDate01 Dec 2006PublicationVLSI-TSA 2006AuthorsC.-H. LinK. DasL. ChangR.Q. WilliamsW. HaenschC. HuIBM-affiliated at time of publicationTopicsPhysical SciencesShare