Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
No abstract available.
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
R.A. Brualdi, A.J. Hoffman
Linear Algebra and Its Applications
Andrew Skumanich
SPIE Optics Quebec 1993