Franco Stellari, Peilin Song, et al.
ISTFA 2014
Conference paper
Time-resolved emission testing challenges for low voltage CMOS technologies
Abstract
The advances of CMOS technologies have challenged the time-resolved emission testing and diagnostics of certain applications. This paper addresses these challenges from both emission tooling and chip design perspective.
Related
Franco Stellari, Peilin Song, et al.
IRPS 2009
G. Karve, X. Zheng, et al.
LEOS 2003
R. Robertazzi, D.J. Frank, et al.
VTS 2024