Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Thin film confinement issues in poly(hydroxy styrene) (PHS) were addressed using both specular x-ray reflectivity (SXR) and incoherent neutron scattering (INS). SXR measured the uniformity and thickness of PHS films supported on various substrates as a function of temperature. On the other hand, INS directly probed the dynamics of a hydrogeneous polymer by measuring the amplitude of the average mean-square atomic displacements.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters