A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Thin film confinement issues in poly(hydroxy styrene) (PHS) were addressed using both specular x-ray reflectivity (SXR) and incoherent neutron scattering (INS). SXR measured the uniformity and thickness of PHS films supported on various substrates as a function of temperature. On the other hand, INS directly probed the dynamics of a hydrogeneous polymer by measuring the amplitude of the average mean-square atomic displacements.
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering