K.A. Chao
Physical Review B
Thin film confinement issues in poly(hydroxy styrene) (PHS) were addressed using both specular x-ray reflectivity (SXR) and incoherent neutron scattering (INS). SXR measured the uniformity and thickness of PHS films supported on various substrates as a function of temperature. On the other hand, INS directly probed the dynamics of a hydrogeneous polymer by measuring the amplitude of the average mean-square atomic displacements.
K.A. Chao
Physical Review B
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990