Thermal strain in lead thin films I: Dependence of the strain on crystal orientation

Abstract

The dependences on crystal orientation of strains normal to a film surface and of the resolved shear stress for dislocation glide were calculated for Pb thin films strained by an underlying substrate using the biaxial strain model. These results are plotted on (111) stereographic projections. The calculated values compare favorably with experimental values obtained by X-ray diffraction on Pb films deposited onto oxidized Si substrates at room temperature and subsequently cooled to lower temperatures. © 1977.