Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
The Cu(1 0 0)-c(2 × 2) N reconstructed surface has been studied by combined non-contact force and tunneling microscopy. Frequent tip changes produced all kinds of contrast in the interaction between the tip and differently reconstructed areas on the surface. Atomic resolution has been obtained using the tunneling current as feedback. © 2002 Elsevier Science B.V. All rights reserved.
T.N. Morgan
Semiconductor Science and Technology
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
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Physica A: Statistical Mechanics and its Applications
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering