A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
Two techniques for determining threshold are compared to capatitance date. Errors from using 77 K thresholds are determined and the effect on measurements on NA+ doped samples estimated. © 1980, All rights reserved.
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
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SPIE Advanced Lithography 2008
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Microelectronic Engineering