M.A. Taubenblatt, J.S. Batchelder
Applied Optics
Surface inspection techniques are used for process learning, quality verification, and postmortem analysis in manufacturing for a spectrum of disciplines. We will first summarize trends in surface analysis for integrated circuits, high density interconnection boards, and magnetic disks, emphasizing on-line applications as opposed to off-line or development techniques. We will then look more closely at microcontamination detection from both a patterned defect and a particulate inspection point of view.
M.A. Taubenblatt, J.S. Batchelder
Applied Optics
J.S. Batchelder, M.A. Taubenblatt
Microcontamination
D. Guidotti, J.S. Batchelder, et al.
Applied Physics Letters
D. Guidotti, J.S. Batchelder, et al.
Journal of Applied Physics