Robert W. Keyes
Physical Review B
An overview of surface and interface analysis within IBM is presented. The types of materials concerned; the areas in which surface analysis is having major impact; and the relative importance of different analytical techniques are discussed, together with perspectives for the future. Selected examples from Research Division work are presented to illustrate the range of materials work and techniques involved. © 1986 Springer-Verlag.
Robert W. Keyes
Physical Review B
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting