Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Paper
Superconducting electronics testing
Abstract
An I/O assembly has been designed and constructed to support the operation of superconducting circuitry. The system, previously described9 for chip testing, has been adapted for use with a Josephson technology system level experiment. The cryoinsert assembly, constructed of non-magnetic parts, provides 80 high frequency I/O lines between room temperature and 4.2 K. © 1983.
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