Summary Abstract: Scanning tunneling microscopy imaging and registration of the (v 3 x v3) R30° Ag/Si(111) surface

T. Schneider, E. Stoll

Physical Review B

Sung Ho Kim, Oun-Ho Park, et al.

Small

K.A. Chao

Physical Review B

J.K. Gimzewski, T.A. Jung, et al.

Surface Science