Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
The morphologies of single height atomic steps were studied on Si(001) samples with a miscut of ∼0°-0.05°using dark-field low-energy electron microscopy. In addition to the previously observed wavy step phase we identify a ''hilly'' phase at miscut angles <0.03°. This phase exhibits steps in excess of those required by the local miscut, but their morphology is qualitatively different from the straight steps predicted by theory. © 1993 The American Physical Society.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
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SPIE Optical Materials for High Average Power Lasers 1992
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MRS Spring 2000