S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Imran Nasim, Melanie Weber
SCML 2024
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SPIE Advanced Lithography 2007
Ellen J. Yoffa, David Adler
Physical Review B