R. Ghez, J.S. Lew
Journal of Crystal Growth
The author discusses the use of the scanning tunnelling microscope as a spectroscopic tool. Several methods of obtaining spectroscopic information are reviewed. The strengths and weaknesses of scanning tunnelling microscopy are discussed in comparison with more conventional surface spectroscopy techniques.
R. Ghez, J.S. Lew
Journal of Crystal Growth
Ming L. Yu
Physical Review B
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Imran Nasim, Melanie Weber
SCML 2024