Gerhard Meyer, Nabil M. Amer
Applied Physics Letters
Paper
Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
Abstract
An atomic force microscope capable of measuring, simultaneously yet separately, lateral ("frictional") and normal forces is described. A direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.
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