Jascha Repp, Gerhard Meyer, et al.
Physical Review Letters
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Jascha Repp, Gerhard Meyer, et al.
Physical Review Letters
Wolfram Steurer, Jascha Repp, et al.
Physical Review Letters
Zsolt Majzik, Niko Pavliček, et al.
Nature Communications
Justus Krüger, Niko Pavliček, et al.
ACS Nano