Jascha Repp, Gerhard Meyer, et al.
Physical Review Letters
Paper
Novel optical approach to atomic force microscopy
Abstract
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Related
Niko Pavliček, Bruno Schuler, et al.
Nature Chemistry
Wei Liu, Bruno Schuler, et al.
Journal of Physical Chemistry Letters
Wolfram Steurer, Bruno Schuler, et al.
Nano Letters