Silicon Micro Mechanics (SIMM): Si-beams with rectangular cross-section for atomic force sensing by means of STM

William Hinsberg, Joy Cheng, et al.

SPIE Advanced Lithography 2010

E. Burstein

Ferroelectrics

Thomas E. Karis, C. Mark Seymour, et al.

Rheologica Acta

Sung Ho Kim, Oun-Ho Park, et al.

Small