Analytical Chemistry

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01 May 2002

Secondary Ion Emission and Sputter Yields from Metal Targets under F₂⁺Bombardment

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Abstract

No abstract available.

Paper

Detection Sensitivities for Thick Specimens in Proton and Electron Induced X-ray Spectrometry

Wilhad Reuter, Allen Lurio

Analytical Chemistry

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Summary Abstract: The origin of oxidation induced enhancement of Si⁺ sputter yield in SIMS

D.J. Vitkavage, J.G. Clabes, et al.

JVSTA

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Electron probe microanalysis

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Surface Science

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Detection sensitivities in proton and electron induced X-ray spectroscopy

Wilhad Reuter, Allen Lurio

Nuclear Instruments and Methods

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