PublicationAnalytical ChemistryPaperSecondary Ion Emission and Sputter Yields from Metal Targets under F2+BombardmentAnalytical ChemistryView publicationAbstractNo abstract available.Home↳ PublicationsDate01 May 2002PublicationAnalytical ChemistryAuthorsWilhad ReuterJ.G. ClabesIBM-affiliated at time of publicationShare