Pritish Narayanan, Stefano Ambrogio, et al.
IEEE T-ED
We detail the use of ring oscillators (ROs) for yield learning during the research phase of a CMOS technology generation. Failing circuits are located and classified based on electrical analysis of ROs and FETs (Field Effect Transistor) wired out from RO environments.
Pritish Narayanan, Stefano Ambrogio, et al.
IEEE T-ED
Victor Chan, M. Bergendahl, et al.
ASMC 2020
Victor Chan, Ken Rim, et al.
CICC 2005
Manuel Le Gallo, Riduan Khaddam-Aljameh, et al.
Nature Electronics