Publication
ASMC 2018
Conference paper

Ring oscillator yield learning methodologies for CMOS technology research

View publication

Abstract

We detail the use of ring oscillators (ROs) for yield learning during the research phase of a CMOS technology generation. Failing circuits are located and classified based on electrical analysis of ROs and FETs (Field Effect Transistor) wired out from RO environments.

Date

05 Jun 2018

Publication

ASMC 2018

Authors

Share