Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Renu Tewari, Richard P. King, et al.
IS&T/SPIE Electronic Imaging 1996