P. Alnot, D.J. Auerbach, et al.
Surface Science
Shubnikov-de Haas and persistent photoconductivity measurements are used to study the mobility, free electron density (n) and the occupancy of the DX centre in heavily doped n-GaAs as a function of doping level and hydrostatic pressure. The results show that the DX centre produces a resonant donor level between the γ - and L-conduction band minima at a concentration comparable with the doping level. For the Si-doped samples, comparison with local vibration mode measurements indicates that the DX level can be identified with SiGaThe level acts to pin the Fermi energy at electron concentrations around 1.8 ȕ 1019 cm‒3Analysis of the results indicates that macroscopic charge separation is not responsible for persistent photoconductivity in these samples. © 1988 IOP Publishing Ltd.
P. Alnot, D.J. Auerbach, et al.
Surface Science
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Michiel Sprik
Journal of Physics Condensed Matter
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009