Publication
Journal of Crystal Growth
Paper

Optical characterization of compound semiconductor alloys

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Abstract

A review is presented of the optical measurement techniques as they have been applied to the characterization of III–V compounds and alloys. The methods discussed and the more detailed examples cited are: absorption (AIP, Ga1−xAlxP), reflectance, cathodoluminescence (Ga1−xAlxAs), photoluminescence (GaAs1−yPy), electroluminescence (time-decay of Ga1−xAlxAs EL), and automated photoluminescence materials screening (GaAs1−yPy). © 1974, North-Holland Publishing Company. All Rights Reserved. All rights reserved.

Date

01 Jan 1974

Publication

Journal of Crystal Growth

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