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Physical Review Letters
Paper

Observation of single charge carriers by force microscopy

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Abstract

The scanning force microscope is used to deposite charge carriers on insulating Si3N4 films and to monitor their recombination. The charge decay shows up as a discontinuous staircase, demonstrating single-carrier resolution. The decay is found to be controlled by thermionic emission. © 1990 The American Physical Society.

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Physical Review Letters

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