S.F. Alvarado, C. Carbone
Physica B+C
The scanning force microscope is used to deposite charge carriers on insulating Si3N4 films and to monitor their recombination. The charge decay shows up as a discontinuous staircase, demonstrating single-carrier resolution. The decay is found to be controlled by thermionic emission. © 1990 The American Physical Society.
S.F. Alvarado, C. Carbone
Physica B+C
M. Pfister, M. Johnson, et al.
Applied Surface Science
M. Kemerink, S.F. Alvarado, et al.
Physical Review B - CMMP
M. Pfister, M. Johnson, et al.
Applied Physics Letters