K. Johnson, P. Ivett, et al.
Journal of Applied Physics
Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.
K. Johnson, P. Ivett, et al.
Journal of Applied Physics
G. Salis, S.F. Alvarado, et al.
Physical Review B - CMMP
M. Kemerink, S.F. Alvarado, et al.
MRS Proceedings 2003
S.F. Alvarado, L. Rossi, et al.
IBM J. Res. Dev