Publication
Applied Physics Letters
Paper

New method of observing electron penetration profiles in solids

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Abstract

Electron penetration and scattering in solids can be measured by electron beam exposure of a positive electron resist. The beam profile is obtained by exposing a long line of controlled width in a thick layer of poly-(methyl methacrylate) resist. The cross section of the developed line which can be examined in the scanning electron microscope represents the beam density profile. © 1971 The American Institute of Physics.

Date

22 Oct 2003

Publication

Applied Physics Letters

Authors

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