Publication
Chemical Communications
Paper

Nanowire growth kinetics in aberration corrected environmental transmission electron microscopy

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Abstract

We visualize atomic level dynamics during Si nanowire growth using aberration corrected environmental transmission electron microscopy, and compare with lower pressure results from ultra-high vacuum microscopy. We discuss the importance of higher pressure observations for understanding growth mechanisms and describe protocols to minimize effects of the higher pressure background gas.

Date

28 Apr 2016

Publication

Chemical Communications

Authors

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