Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
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SPIE Advanced Lithography 2007
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