Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
John G. Long, Peter C. Searson, et al.
JES
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
R. Ghez, J.S. Lew
Journal of Crystal Growth