Three dimensional CMOS devices and integrated circuits
Meikei Ieong, Kathryn W. Guarini, et al.
CICC 2003
Ideally, a metal-oxide-semiconductor field-effect transistor (MOSFET) has high drive current and low leakage current. As the MOSFET channel length is reduced to 50 nm and below, the suppression of off-state leakage current becomes an increasingly difficult technological challenge-one that will ultimately limit the scalability of the conventional MOSFET structure. This paper reviews recent research performed at the University of California at Berkeley on advanced transistor structures that can extend the limit of device scaling to below 10 nm for future generations of MOS technology.
Meikei Ieong, Kathryn W. Guarini, et al.
CICC 2003
Shubham Jain, Swagath Venkataramani, et al.
DAC 2019
Sae Kyu Lee, Ankur Agrawal, et al.
IEEE JSSC
Jing Li, Robert Montoye, et al.
VLSI Technology 2013